Oral presentation

03. Optics and Photonics » 3.8 Optical measurement technology and devices

[17p-S8-1~13] 3.8 Optical measurement technology and devices

Wed. Sep 17, 2014 1:30 PM - 5:00 PM S8 (S8)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

+Add all to schedule

Lunch 12:00～13:30 (12:00 PM - 1:30 PM)

1:30 PM - 1:45 PM

[17p-S8-1] the measurement of chemical material in the organism

^○Syuuichi Kanno¹, Yasuhiro Maeda², Takayo Ogawa², Norihito Saito², Satoshi Wada² (TOKYO UNIVERCITY OF SCIENCE¹, RIKEN²)

1:45 PM - 2:00 PM

△ [17p-S8-2] Control of a Copper Sulfate Plating Solution by a Waveguide-Mode Sensor

^○(M1)Kotaro Sato¹, Yoshimichi Ohki^1,2, Makoto Fujimaki³, Koichi Awazu³ (School of ASE, Waseda Univ.¹, RIMST, Waseda Univ.², AIST³)

2:00 PM - 2:15 PM

△ [17p-S8-3] Analysis of Surface Strain of Largely Bending Films by Means of Soft Gratings

^○Norihisa Akamatsu¹, Wataru Tashiro¹, Shigenori Fujikawa², Junichi Takeya³, Atsushi Shishido¹ (Tokyo Tech¹, Kyushu Univ.², Univ. Tokyo³)

2:15 PM - 2:30 PM

△ [17p-S8-4] Distributed strain/temperature sensing based on Brillouin scattering in plastic optical fibers

^○(DC)Neisei Hayashi¹, Yosuke Mizuno¹, Kentaro Nakamura¹ (Tokyo Tech¹)

2:30 PM - 2:45 PM

△ [17p-S8-5] Ultra-sensitive strain/temperature measurement based on multimode interference in perfluorinated plastic optical fibers

^○Goki Numata¹, Neisei Hayashi¹, Marie Tabaru¹, Yosuke Mizuno¹, kentaro Nakamura¹ (Tokyo Tech¹)

2:45 PM - 3:00 PM

[17p-S8-6] Time resolved measurement of high temperature micro region generating on a tip of optical fiber

^○Kazuo Maeda¹, Masahiko Miyara¹, Takahiro Fujimoto¹, Kazuyoku Tei¹, Shiguru Yamaguchi¹ (Tokai Univ.¹)

Break 15:00～15:15 (3:00 PM - 3:15 PM)

3:15 PM - 3:30 PM

[17p-S8-7] Measurement of ITO transparent electrode film thickness with white-light interferometer

^○(D)Kai Chen¹, Feng Lei¹, Masahide Itoh¹ (Tsukuba Univ.¹)

3:30 PM - 3:45 PM

[17p-S8-8] Influences of surface integrity in wafer thickness measurements by reflection spectroscopy

^○Teppei Onuki¹, Hirotaka Ojima¹, Jun Shimizu¹, Libo Zhou¹ (Ibaraki Univ.¹)

3:45 PM - 4:00 PM

▲ [17p-S8-9] Development of the 2D singleshot, long range tomography and profilometry with consideration of the rapid calculation of interference fringe order

^〇Tuan Banh Quoc¹, Shioda Tatsutoshi² (Nagaoka University of Technology¹, Saitama University²)

4:00 PM - 4:15 PM

▲ [17p-S8-10] Polarization Phase Shifting Analysis on The Pixelated Phase-Mask Dynamic Interferometer

^〇(P)David Serrano, Otani Yukitoshi (Center for Optical Research & Education (CORE) - Utsunomiya University)

4:15 PM - 4:30 PM

[17p-S8-11] Optical characterization of a liquid crystal variable retarder by the four detector polarimeter

Satoshi Ishizawa¹, ^○Toshihide Tsuru¹ (Fac. Edu., Art and Sci., Yamagata Univ.¹)

4:30 PM - 4:45 PM

[17p-S8-12] Dual rotating Stokes polarimeter and method of retarder

^○Shuhei Shibata¹, Shuichi Kawabata², Yukitoshi Otani¹ (Utsunomiya Univ.¹, Tokyo Polytechnic Univ.²)

4:45 PM - 5:00 PM

△ [17p-S8-13] Calibration method for diattenuation parameter on a pixelated polarization camera

^○Shuehi Shibata¹, Yukitoshi Otani¹ (Utsunomiya Univ.¹)