[17p-A13-1~6] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17p-A13-1] Time-resolved x-ray diffraction study of Pr_0.5Ca_0.5MnO₃ thin films by XFEL

^○Hiroki Wadati¹, Paul Beaud^2,3, Andrin Caviezel², Simon Mariager², Laurenz Rettig², Gerhard Ingold³, Christian Dornes⁴, Shin Wen Huang², J. A. Johnson², Milan Radovic², Thomas Huber⁴, Teresa Kubacka⁴, Andres Ferrer^2,4, Henrik Lemke⁵, Matthieu Chollet⁵, Diling Zhu⁵, James Glownia⁵, Marcin Sikorski⁵, Aymeric Robert⁵, Masao Nakamura⁶, Masashi Kawasaki^1,6, Yoshinori Tokura^1,6, Steven Johnson⁴, Urs Staub² (Univ. of Tokyo¹, SLS², SwissFEL³, ETH⁴, LCLS⁵, IKEN CEMS⁶)

Keywords:X線