[17p-A13-1~6] Phase problem in the analysis of buried interfaces by X-ray reflectivity andsurface X-ray scattering - Towards new research with coherent light sources

[17p-A13-5] Direct methods of X-ray CTR scattering structure analysis and their application to topological insulator interfaces

^○Tetsuroh Shirasawa^1,2 (ISSP, Univ. of Tokyo¹, JST, PRESTO²)

Keywords:X線CTR散乱,トポロジカル絶縁体