[17p-A16-1~14] 13.4 Devices/Integration Technologies

[17p-A16-7] Defect-assisted single-electron transport in short-channel tunnel field-effect transistor

^○Keiji Ono¹, Takahiro Mori², Satoshi Moriyama³ (RIKEN¹, AIST², NIMS³)

Keywords:単一電子