[17p-C1-1~15] 3.12 Nanoscale optical science and near-field optics

[17p-C1-14] Nano-scale Elemental Analysis of Metallic Interface using SR-STM -Comparison of Elemental Contrast and Tunneling Spectrum-

^○Yudai Furudate^1,2, Akira Saito^1,2, Yuta Kusui^1,2, Tomoyuki Saito^1,2, Yoshihito Tanaka², Kenji Tamasaku², Yoshiki Kohmura², Megumi Akai¹, Tetsuya Ishikawa², Masakazu Aono³, Yuji Kuwahara^1,2 (Osaka Univ.¹, RIKEN/SPring-8², NIMS³)

Keywords:X線,STM,元素識別