The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

15. Crystal Engineering » 15.4 III-V-group nitride crystals

[17p-C5-1~18] 15.4 III-V-group nitride crystals

Wed. Sep 17, 2014 1:15 PM - 6:45 PM C5 (Open Hall)

2:15 PM - 2:30 PM

[17p-C5-4] Synchrotron X-ray crystallinity evaluation of GaN single-crystal wafers grown by Na flux method

○(M2)Shuhei Fukuda1, Yoshiyuki Tsusaka1, Hidekazu Takano1, Yasushi Kagoshima1, Soichi Nose2, Shingo Takeda2, Kazushi Yokoyama2, Junji Matsui2, Masayuki Imanishi3, Yuma Todoroki3, Mihoko Maruyama3, Mamoru Imade3, Masashi Yoshimura3, Yusuke Mori3 (Univ. of Hyogo1, Hyogo Synchrotron Radiation Nanotechnology Lab.2, Osaka Univ.3)

Keywords:半導体