10:00 AM - 10:15 AM
[18a-A17-5] Observation of pair structure of threading dislocation and nano-groove in 4H-SiC wafer by mirror projection electron microscopy
Keywords:欠陥評価,ミラー電子顕微鏡,SiC
Oral presentation
15. Crystal Engineering » 15.6 IV-group-based compounds
Thu. Sep 18, 2014 9:00 AM - 12:30 PM A17 (E308)
10:00 AM - 10:15 AM
Keywords:欠陥評価,ミラー電子顕微鏡,SiC