The 75th JSAP Autumn Meeting, 2014

Presentation information

Print

Oral presentation

15. Crystal Engineering » 15.6 IV-group-based compounds

[18a-A17-1~13] 15.6 IV-group-based compounds

Thu. Sep 18, 2014 9:00 AM - 12:30 PM A17 (E308)

11:15 AM - 11:30 AM

[18a-A17-9] Defect characterization for p-type SiC epilayers toward photoelectrode application

○Masashi Kato1, Yoshitaka Nakano2 (Nagoya Inst. of Tech.1, Chubu Univ.2)

Keywords:SiC,光電極,欠陥