10:00 AM - 10:15 AM
[18a-A22-5] Relative Importance of Interface-Roughness Scattering and Alloy-Disorder Scattering in AlGaN/GaN HEMTs
Keywords:界面凹凸,合金,波動関数
Presentation information
Oral presentation
14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.3 Electron devices and Process technology
[18a-A22-1~12] 14.3 Electron devices and Process technology
Thu. Sep 18, 2014 9:00 AM - 12:15 PM A22 (E314)