3:45 PM - 4:00 PM
[18p-A14-10] Low vacuum SIMS measurement of volatile composite sample by using MeV-energy heavy ions
Keywords:低真空,二次イオン質量分析,MeV重イオン
Oral presentation
07. Beam Technology and Nanofabrication » 7.6 Ion beams
Thu. Sep 18, 2014 1:15 PM - 6:15 PM A14 (E305)
3:45 PM - 4:00 PM
Keywords:低真空,二次イオン質量分析,MeV重イオン