PDF Download Schedule 9 Like 0 4:45 PM - 5:00 PM [18p-A17-11] Erching Rate Behavior of SiC Wafer Using ClF3 Gas ○Ken Nakagomi1, Dairi Yajima1, Hitoshi Habuka1, Tomohisa Kato2 (Yokohama National Univ.1, AIST2) Keywords:エッチング