[18p-PA7-1~16] 6.3 Oxide-based electronics

▲ [18p-PA7-5] Electron-beam-induced current study of dislocation related defects in SrTiO3 crystal

^○Jun Chen¹, Jianyong Li², Wei Yi^1,3, Atsushi Ogura³, Takashi Sekiguchi¹ (NIMS¹, JST², Meiji Univ.³)

Keywords:SrTiO3,EBIC,Dislocation