Detection of Effect of the difference of Uniaxial Strain on the Valence Band of SiGe by HXPES with High Spatial Resolution

Presentation information

Poster presentation

15. Crystal Engineering » 15.5 IV-group crystals and IV-IV-group mixed crystals

Thu. Sep 18, 2014 1:30 PM - 3:30 PM PB10 (Gymnasium2)

ポスター掲示時間13:30～15:30(PB10会場)

1:30 PM - 3:30 PM

^○Shunta Yamahori¹, Takuya Sakurai¹, Shun Yonekubo¹, Jin Arai¹, Kentarou Sawano¹, Eiji Ikenaga², Hiroshi Nohira¹ (TCU¹, JASRI²)

Keywords:一軸歪み,SiGe,X線光電子分光