Analysis of luminescent centers in Eu-activated phosphors using X-ray excited optical luminescence (XEOL)

Presentation information

Poster presentation

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.4 Optical properties and light-emitting devices

Thu. Sep 18, 2014 1:30 PM - 3:30 PM PB8 (Gymnasium2)

ポスター掲示時間13:30～15:30(PB8会場)

1:30 PM - 3:30 PM

^○Tetsuo Honma¹, Takashi Kunimoto², Yoshiko Fujita² (JASRI¹, Tokubun Univ.²)

Keywords:XEOL,XAFS,蛍光体