9:30 AM - 11:30 AM
[19a-PA6-3] Absolute length interferometry using a vertical-cavity-surface-emitting-laser diode with linearized frequency scanning
Keywords:波長走査干渉計,ブロックゲージ,半導体レーザ
Presentation information
Poster presentation
03. Optics and Photonics » 3.8 Optical measurement technology and devices
[19a-PA6-1~10] 3.8 Optical measurement technology and devices
Fri. Sep 19, 2014 9:30 AM - 11:30 AM PA6 (Gymnasium1)
ポスター掲示時間9:30～11:30(PA6会場)