[19p-A10-1~22] 6.3 Oxide-based electronics

△ [19p-A10-11] Topological Hall effect in EuO thin films

^○Yuki Ohuchi¹, Masaki Uchida¹, Yusuke Kozuka¹, Kazunori Ueno^2,3, Atsushi Tsukazaki^2,4, Masashi Kawasaki^1,5 (Dept. of Applied Physics, the Univ. of Tokyo¹, Dept. of Basic Science, the Univ. of Tokyo², IMR, Tohoku Univ.³, JST-PRESTO⁴, CEMS, RIKEN⁵)

Keywords:EuO