The 75th JSAP Autumn Meeting, 2014

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Poster presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[19p-PB7-1~6] 15.8 Crystal evaluation, impurities and crystal defects

Fri. Sep 19, 2014 4:00 PM - 6:00 PM PB7 (Gymnasium2)

ポスター掲示時間16:00～18:00(PB7会場)

4:00 PM - 6:00 PM

△ [19p-PB7-2] Evaluation of GaN crystal by X-rays topography.

○Makoto Tominaga1, Shogo Ando1, Hidekazu Yamamoto1 (Chiba.Inst of Tech1)

Keywords:GaN,Ｘ線トポグラフィ,評価