4:00 PM - 6:00 PM
△ [19p-PB7-4] Evaluation of stacking fault in SiC substrate by TEM
Keywords:透過電子顕微鏡,積層欠陥
Poster presentation
15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects
Fri. Sep 19, 2014 4:00 PM - 6:00 PM PB7 (Gymnasium2)
ポスター掲示時間16:00~18:00(PB7会場)
4:00 PM - 6:00 PM
Keywords:透過電子顕微鏡,積層欠陥