[20a-S2-1~12] 10.2 スピントルク・スピン流・回路・測定技術

▼ [20a-S2-2] Current and field induced domain wall creep in Ta/CoFeB/MgO/Ta wire

^〇Samik Duttagupta¹，Shunsuke Fukami^2,3，Michihiko Yamanouchi^1,2，Chao Ling Zhang¹，Hideo Sato^2,3，Fumihiro Matsukura^1,2,4，Hideo Ohno^1,2,3,4 (Laboratoty for Nanoelectronics and Spintronics, RIEC, Tohoku University¹，CSIS, Tohoku University²，CIES, Tohoku University³，WPI-AIMR, Tohoku University⁴)

キーワード：MRAM (including circuit and device designs)