Oral presentation
07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis
Tue. Mar 18, 2014 9:00 AM - 12:00 PM F5 (F305)
△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation
9:00 AM - 9:15 AM
○Mitsutaka Haruta1,2, Takuro Nagai2, Keiji Kurashima2, Yuichi Shimakawa1, Hiroki Kurata1, Koji Kimoto2 (ICR, Kyoto University1, NIMS2)
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9:15 AM - 9:30 AM
○Tomoki Akita1, Yasushi Maeda1, Masanori Kohyama1 (AIST1)
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9:30 AM - 9:45 AM
○Mitsunori Kitta1, Tomoki Akita1, Masanori Kohyama1 (AIST, UBIQ.1)
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9:45 AM - 10:00 AM
Norihiro Imaeda1, Hiroki Murase1, ○Tadahiro Kawasaki1,4, Kayo Yamasaki2, Takaomi Matsutani2, Takayoshi Tanji3,4 (Nagoya Univ.1, Kinki Univ.2, EcoTopia, Nagoya Univ.3, GREEN4)
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10:00 AM - 10:15 AM
○（D）Takafumi Ishida1, Tadahiro Kawasaki1, Tetsuji Kodama2, Keiko Ogai3, Takashi Ikuta4, Takayoshi Tanji5 (Nagoya Univ.1, Meijo Univ.2, APCO Ltd.3, Osaka Electro-Comm. Univ.4, Nagoya Univ. EcoTopia Sci. Inst.5)
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10:15 AM - 10:30 AM
○Yoshihiro Midoh1, Koji Nakamae1 (Osaka Univ1)
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Break 10:30〜10:45 (10:30 AM - 10:45 AM)
10:45 AM - 11:00 AM
○（M1）Kentaro Kumagai1, Yuki Handa1, Sosuke Hosoi1, Masatoshi Kotera1 (Osaka Inst.1)
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11:00 AM - 11:15 AM
○Yuki Handa1, Kentarou Kumagai1, Sosuke Hosoi1, Masatoshi Kotera1 (Osaka Inst.1)
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11:15 AM - 11:30 AM
○Sosuke Hosoi1, Kentaro Kumagai1, Yuki Handa1, Masatosi Kotera1 (Osaka Inst.1)
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11:30 AM - 11:45 AM
○Hideaki Kitazawa1, Hiroshi Shinkai2, Kenichiro Kono1, Yoshihiko Takeda1, Hideo Iwai1, Akira Tamaki2, Daisuke Fujita1, Hirohisa Yamada1 (NIMS1, Tokyo Denki Univ.2)
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11:45 AM - 12:00 PM
○Toma Yorisaki1, Reiko Saito1, Haruko Akutsu2 (Toshiba Corporate Manufacturing and Engineering Center1, Toshiba Semiconductor and Storage products Company2)
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