Session information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19a-D5-1~12] 6.6 Probe microscopy

Wed. Mar 19, 2014 9:00 AM - 12:15 PM D5 (D207)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

+Add all to schedule

9:00 AM - 9:15 AM

[19a-D5-1] Atomic-resolution Imaging of Calcite Crystal Growth by High-speed FM-AFM in liquid

^○Kazuki Miyata¹, Hitoshi Asakawa², Takeshi Fukuma^1,2,3 (Grad. School, Kanazawa Univ.¹, Bio-FRC., Kanazawa Univ.², ACT-C/JST³)

9:15 AM - 9:30 AM

△ [19a-D5-2] Interface Ion Conductance Microscopy and its Application in Lithium-ion Batteries

^○Akichika Kumatani¹, Yasufumi Takahashi², Hirotaka Inomata¹, Hirokazu Munakata³, Kousuke Ino¹, Hitoshi Shiku¹, Kiyoshi Kanamura³, Tomokazu Matsue^1,2 (Tohoku Univ.¹, Tohoku Univ. WPI-AIMR², Tokyo Metro. Univ.³)

9:30 AM - 9:45 AM

△ [19a-D5-3] Environmental controlled non-contact atomic force microscopy observation of etching of Si surfaces by atomic hydrogen irradiation

^○Tomoaki Miyagi¹, Akira Sasahara¹, Masahiko Tomitori¹, Ryohei Kokawa², Ohta Masahiro², Hirofumi Yamada³, Kei Kobayashi^3,4, Noriaki Oyabu⁵ (JAIST.¹, Shimadzu Corp.², Kyoto Univ.³, Hakubi Center Kyoto Univ.⁴, JST⁵)

9:45 AM - 10:00 AM

△ [19a-D5-4] Analysis of surface states with a charge amplifier installed in NC-AFM

^○Makoto Nogami¹, Toyoko Arai², Akira Sasahara¹, Masahiko Tomitori¹ (JAIST¹, Kanazawa Univ.²)

10:00 AM - 10:15 AM

△ [19a-D5-5] Observation of dipole moment distribution on Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy

^○Masataka Suzuki¹, Kohei Yamasue¹, Masayuki Abe², Yoshiaki Sugimoto³, Yasuo Cho¹ (Tohoku Univ.¹, Nagoya Univ.², Osaka Univ.³)

Break 10:15〜10:30 (10:15 AM - 10:30 AM)

10:30 AM - 10:45 AM

△ [19a-D5-6] Reduction of resistance fluctuation of scanning spread resistance microscope

^○Kazunori Harada¹, Junji Kataoka¹, Hidehiko Yabuhara¹, Jun Hirota², Tsukasa Nakai² (Toshiba Corp. Corporate Manufacturing Engineering Center¹, Toshiba Corp. S&S Products Company²)

10:45 AM - 11:00 AM

△ [19a-D5-7] Detecting Magnetic Exchange Force in the Surface of NiO(001) in Room Temperature

^○Eiji Arima¹, Kiho Isoyama¹, Ikumi Tokuda¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

11:00 AM - 11:15 AM

[19a-D5-8] A signal detection circuit uitable to a quartz force sensor for NC-AFM

^○（D）Hiroaki Ooe¹, Toyoko Arai¹ (Kanazawa Univ.¹)

11:15 AM - 11:30 AM

[19a-D5-9] Fabrication and Development of Reuse Process of a Small Cantilever Tip for High-resolution FM-AFM Measurements in Liquid

^○Hisanori Izumi¹, Kazuki Miyata¹, Naritaka Kobayashi², Hitoshi Asakawa³, Takeshi Fukuma^1,3,4 (Grad. School, Kanazawa Univ.¹, JSPS Research Fellow(PD)², Bio-AFM FRC., Kanazawa Univ.³, ACT-C, JST⁴)

11:30 AM - 11:45 AM

[19a-D5-10] FM-AFM Study of Atomic-scale Processes at CaF₂(111)-Water Interfaces

^○（PC）Naritaka Kobayashi^1,2, Shiro Itakura¹, Hitoshi Asakawa³, Takeshi Fukuma^1,3,4 (Grad. School, Kanazawa Univ.¹, JSPS Research Fellow (PD)², Bio-AFM FRC, Kanazawa Univ.³, ACT-C, JST⁴)

11:45 AM - 12:00 PM

[19a-D5-11] Analysis of CaF₂(111)-Water Interfaces by 3D Scanning Force Microscopy

^○（B）Keisukie Miyazawa¹, Naritaka Kobayashi², Watkins Matthew³, Shluger Alexander³, Hitoshi Asakawa¹, Takeshi Fukuma^1,4 (Kanazawa Univ¹, JSPS Research Fellow (PD)², University College London³, ACT-C/JST⁴)

12:00 PM - 12:15 PM

[19a-D5-12] Investigation of hydration structures in close proximity of step and terrace structures of alkali halide crystal surfaces

^○Fumiaki Ito¹, Kenichi Umeda¹, Kazuhiro Suzuki¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

▲