Session information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D5-1~13] 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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Lunch 12:15〜13:45 (12:15 PM - 1:45 PM)

1:45 PM - 2:00 PM

[19p-D5-1] A study on relationship between local hydration structure and surface structure/charge using liquid-FM-AFM

^○（PC）Ken-ichi Umeda¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, The Hakubi Centerfor Adv. Res., Kyoto Univ.²)

2:00 PM - 2:15 PM

[19p-D5-2] Verification of glassy state of hydrated water through AFM shear viscoelastic measurement

^○Masami Kageshima¹ (Kansai Medical Univ.¹)

2:15 PM - 2:30 PM

[19p-D5-3] Atom-resolved imaging on KBr(001) by FM-AFM in air

^○（M2）Masashi Koshioka¹, Kouhei Abe¹, Toyoko Arai¹, Masahiko Tomitori², Ryohei Kokawa³, Masahiro Ohta³, Hirofumi Yamada⁴, Kei Kobayashi⁴, Noriaki Oyabu⁵ (Kanazawa Univ.¹, JAIST², Shimadzu³, Kyoto Univ.⁴, JST⁵)

2:30 PM - 2:45 PM

[19p-D5-4] Energy dissipation of AFM by computer simulation

^○Yasuhiro Senda¹, Shuji Shimamura¹, Janne Blomqvist², Risto Nieminen² (Yamaguchi Univ.¹, Aalto Univ.²)

2:45 PM - 3:00 PM

[19p-D5-5] Measurement of localized light intensity distribution using force detection

^○Takashi Tokuyama¹, Junsuke Yamanishi¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (Osaka univ.¹)

3:00 PM - 3:15 PM

[19p-D5-6] Dependence of the Casimir force between fractal surfaces on the separation distance

^○Kosuke Goto¹, Kozo Mochiji¹, Kousuke Moritani¹, Norio Inui¹ (Univ. of Hyogo¹)

Break 15:15〜15:30 (3:15 PM - 3:30 PM)

3:30 PM - 3:45 PM

[19p-D5-7] Atomic resolution imaging of the local contact potential difference with frequency modulation heterodyne Kelvin probe force microscopy

^○Ryosuke Kanbayashi¹, Lili Kou¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

3:45 PM - 4:00 PM

[19p-D5-8] Measurement of the contact potential difference of Pd atoms on alumina thin film

^○Hirotaka Yokoyama¹, Yuta Ashida¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

4:00 PM - 4:15 PM

[19p-D5-9] Surface Potential Mapping of Fullerene Ultrathin film on MoS₂ by FM-KFM（2）

^○Akihiro Noda¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Dept.of Electronic Sci. & Eng., Kyoto Univ.¹, The Hakubi Center for Adv. Res., Kyoto Univ.²)

4:15 PM - 4:30 PM

[19p-D5-10] Simultaneous measurement of topographic and surface potential images using noncontact scanning nonlinear dielectric microscopy

^○Kohei Yamasue¹, Yasuo Cho¹ (Tohoku Univ.¹)

4:30 PM - 4:45 PM

▲ [19p-D5-11] Quasicrystals: a benchmark sample for coulour AFM

^○Pierre Allain^1,2, Denis Damiron^1,2, Yohei Toriyama¹, Keisuke Nagao¹, Dai Kobayashi¹, Keiichi Edagawa¹, Hideki Kawakatsu¹ (IIS, The University of Tokyo¹, LIMMS/CNRS-IIS,The University of Tokyo²)

4:45 PM - 5:00 PM

[19p-D5-12] Force spectroscopy on rutile TiO2(110) surface using AFM

^○Yoshiaki Sugimoto¹, Ayhan Yurtsever², Delia Fernandez-Torre³, Cesar Gonzalez⁴, Pavel Jelinek⁵, Pablo Pou³, Masayuki Abe⁶, Ruben Perez³, Seizo Morita² (Osaka Univ.¹, Osaka Univ. ISIR², Univ. Autonoma de Madrid³, ICMM-CSIC⁴, ASCR⁵, Nagoya Univ.⁶)

5:00 PM - 5:15 PM

▲ [19p-D5-13] An all-optical UHV atomic force microscopy for chemical contrast in lateral mode.

^○（PC）Damiron Denis^1,2, Allain Pierre^1,2, Toriyama Yohei¹, Miyazaki Yuta¹, Kobayashi Dai¹, Kawakatsu Hideki¹ (IIS¹, LIMMS²)

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