The 61st JSAP Spring Meeting, 2014

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Oral presentation

07. Beam Technology and Nanofabrication » 7.6 Ion beams

[17p-F4-1~13] 7.6 Ion beams

Mon. Mar 17, 2014 2:00 PM - 5:30 PM F4 (F304)

5:15 PM - 5:30 PM

[17p-F4-13] Mass imaging of cell level with Ar cluster ion beam

○Sota Torii1, Toshio Seki1, Takaaki Aoki1, Jiro Matsuo1 (Kyoto Univ.1)

Keywords:質量イメージング