Characterization of Resistance-Switching Properties of Ni Nano-dots/SiOx/Ni Diodes

Presentation information

Poster presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

Mon. Mar 17, 2014 4:00 PM - 6:00 PM PG2 (G棟2階)

4:00 PM - 6:00 PM

^○Chong Liu¹, Takashi Arai¹, Akio Ohta², Daichi Takeuchi¹, Hai Zhang¹, Katsunori Makihara¹, Seiichi Miyazaki¹ (Nagoya Univ.¹, Nagoya Univ. VBL²)

Keywords:抵抗変化メモリ