The 61st JSAP Spring Meeting, 2014

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Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[18a-F5-1~11] 7.2 Electron microscopes, evaluation, measurement and analysis

Tue. Mar 18, 2014 9:00 AM - 12:00 PM F5 (F305)

10:00 AM - 10:15 AM

△ [18a-F5-5] Phase Reconstruction using an Annular Array Detector in STEM

○（D）Takafumi Ishida1, Tadahiro Kawasaki1, Tetsuji Kodama2, Keiko Ogai3, Takashi Ikuta4, Takayoshi Tanji5 (Nagoya Univ.1, Meijo Univ.2, APCO Ltd.3, Osaka Electro-Comm. Univ.4, Nagoya Univ. EcoTopia Sci. Inst.5)

Keywords:位相再生,走査透過電子顕微鏡