The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[18a-F5-1~11] 7.2 Electron microscopes, evaluation, measurement and analysis

Tue. Mar 18, 2014 9:00 AM - 12:00 PM F5 (F305)

10:15 AM - 10:30 AM

[18a-F5-6] The effect of non-linear total variation based denoising on TEM electron tomography tilt-series images

Yoshihiro Midoh1, Koji Nakamae1 (Osaka Univ1)

Keywords:電子線トモグラフィ,雑音除去