Temperature Dependence of Resistance of Conductive Nano-filament Formed in Resistance Change Memory

Presentation information

Symposium

Symposium planned by Program Committee » Developments and Challenges for Resistance Change Memories Technology

Tue. Mar 18, 2014 1:15 PM - 6:30 PM E1 (E101)

5:30 PM - 5:45 PM

^○（D）Shintaro Otsuka¹, Yoshifumi Hamada¹, Tomohiro Shimizu¹, Shoso Shingubara¹ (Kansai Univ.¹)

Keywords:ReRAM