[18p-E1-1~14] Developments and Challenges for Resistance Change Memories Technology (抵抗変化メモリ技術の発展及び課題）

▲ [18p-E1-11] Temperature Dependence of Resistance of Conductive Nano-filament Formed in Resistance Change Memory

^○（D）大塚慎太郎，濱田佳典，清水智弘，新宮原正三 (関西大)

キーワード：ReRAM