[18p-E1-1~14] Developments and Challenges for Resistance Change Memories Technology (抵抗変化メモリ技術の発展及び課題）

▲ [18p-E1-13] Characteristic Evaluation of P-type Metal-Oxide-Semiconductor/SiOx/n-SiC/n-Si Resistive Nonvolatile Memory

^○Atsushi Yamashita，Yoshihiko Sato，Takahiro Tsukamoto，Yoshiyuki Suda (Tokyo Univ. of Agric. & Tech)

キーワード：ReRAM