The 61st JSAP Spring Meeting, 2014

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Symposium planned by Program Committee » Developments and Challenges for Resistance Change Memories Technology

[18p-E1-1~14] Developments and Challenges for Resistance Change Memories Technology

Tue. Mar 18, 2014 1:15 PM - 6:30 PM E1 (E101)

2:15 PM - 2:45 PM

▲ [18p-E1-3] Data Retention of TaOx ReRAM in Low Current Operation and after Cycling

○Takeki Ninomiya1, Shunsaku Muraoka1, Zhiqiang Wei1 (Panasonic1)

Keywords:resistance change memories,retention,conductive filament