EXAFS analyses on the (Sc1-xErx)2O3 films grown on Si(111) by MBE

Presentation information

Oral presentation

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.4 Optical properties and light-emitting devices

Tue. Mar 18, 2014 1:15 PM - 5:00 PM E11 (E205)

2:00 PM - 2:15 PM

^○Hiroo Omi¹, Takehiko Tawara¹, Reina Kaji², Takahito Hozumi², Satoru Adachi², Hideki Goto¹, Tetuomi Sougawa¹ (NTT BRL¹, Hokaidou Univ²)

Keywords:分子線エピタキシー,Er,Sc