[18p-F1-1~15] 7.1 X-ray technologies

[18p-F1-5] Sparse Phase Stepping for Two Dimensional X-ray Talbot-Lau Interferometry

^○Takeshi Kondoh¹, Kimiaki Yamaguchi¹, Takashi Date¹, Kentaro Nagai¹, Genta Sato¹, Soichiro Handa¹, Toru Den¹, Hidenosuke Itoh¹, Takashi Nakamura¹ (Canon Inc.¹)

Keywords:phase retreival