[18p-F12-1~11] 3.7 Nano-optics

[18p-F12-8] High resolution imaging by optical near-field microscopy using force detection

^○Junsuke Yamanishi¹, Takashi Tokuyama¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

Keywords:近接場光