Characterization of Local Strain in Embedded Ge<sub>1−x</sub>Sn<sub>x</sub>/Ge Fine Structures by using X-ray Microdiffraction Measurement

Shinichi Ike

Presentation information

Oral presentation

15. Crystal Engineering » 15.5 IV-group crystals and IV-IV-group mixed crystals

[18p-F6-1~20] 15.5 IV-group crystals and IV-IV-group mixed crystals

Tue. Mar 18, 2014 1:30 PM - 6:45 PM F6 (F306)

5:00 PM - 5:15 PM

△ [18p-F6-14] Characterization of Local Strain in Embedded Ge_1−xSn_x/Ge Fine Structures by using X-ray Microdiffraction Measurement

^○Shinichi Ike¹, Yoshihiko Moriyama², Masashi Kurosawa^1,3, Noriyuki Taoka¹, Osamu Nakatsuka¹, Yasuhiko Imai⁴, Shigeru Kimura⁴, Tsutomu Tezuka², Shigeaki Zaima¹ (Nagoya Univ.¹, AIST-GNC², JSPS Research Fellow (PD)³, JASRI⁴)

Keywords:Ge,GeSn,マイクロ回折

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Presentation information

[18p-F6-1~20] 15.5 IV-group crystals and IV-IV-group mixed crystals

△ [18p-F6-14] Characterization of Local Strain in Embedded Ge1−xSnx/Ge Fine Structures by using X-ray Microdiffraction Measurement

△ [18p-F6-14] Characterization of Local Strain in Embedded Ge_1−xSn_x/Ge Fine Structures by using X-ray Microdiffraction Measurement