[18p-PA10-1~5] 3.3 Equipment and device optics

[18p-PA10-5] Measurement of Wevelength Dependence of Optical Rotation Using a Measurement System with a Liquid Crystal Grating

^○Makito Hourai¹, Michinori Honma¹, Toshiaki Nose¹, Etsuo Uchida², Hiroo Saito², Takeshi Harada², Seiei Muto² (Akita Pref. Univ.¹, Mutodenshikogyo Ltd.²)

Keywords:液晶