The 61st JSAP Spring Meeting, 2014

Presentation information

Poster presentation

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[18p-PG1-1~2] 7.2 Electron microscopes, evaluation, measurement and analysis

Tue. Mar 18, 2014 1:30 PM - 3:30 PM PG1 (G棟2階)

1:30 PM - 3:30 PM

[18p-PG1-2] Chemical bonding states of Si in Si-based negative electrodes for Li+ secondary batteries studied by Hard X-ray Photoelectron Spectroscopy

Shin Takahashi1, Takayuki Tsubota1, Son J.-Y.2, Oji Hiroshi2, Cui Y.-T.2 (Kobelco Research Institute1, JASRI2)

Keywords:硬X線光電子分光,二次電池