Tunneling current measurement of Al/CaF<sub>2</sub>/Si MIS structures

Presentation information

Poster presentation

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.2 Ultrathin films and quantum nanostructures

Tue. Mar 18, 2014 1:30 PM - 3:30 PM PG2 (G棟2階)

1:30 PM - 3:30 PM

^○（D）Keita Suda¹, Junya Denda¹, Yuya Kuwata¹, Yuta Koshita¹, Masahiro Watanabe¹ (Tokyo Inst. of Tech.¹)

Keywords:トンネル効果,CaF2,MIS構造