The 61st JSAP Spring Meeting, 2014

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06. Thin Films and Surfaces » 6.6 Probe microscopy

[18p-PG9-1~13] 6.6 Probe microscopy

Tue. Mar 18, 2014 4:00 PM - 6:00 PM PG9 (G棟2階)

4:00 PM - 6:00 PM

[18p-PG9-1] The conductance measurement of nano structures by Face-to-Face Dual-Probe Microscopy

○Mitsuhiro Ito1, Shu Kurokawa1, Akira Sakai1 (Kyoto Univ.1)

Keywords:走査型トンネル顕微鏡