[18p-PG9-1~13] 6.6 Probe microscopy

[18p-PG9-13] Advancing X-ray Aided Noncontact Atomic Force Microscopy (XANAM) - I

^○Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Asakura Kiyotaka² (Nagoya Univ.¹, Hokkaido Univ.², ICU³, KEK-PF⁴)

Keywords:非接触原子間力顕微鏡　放射光X線