The 61st JSAP Spring Meeting, 2014

Presentation information

Poster presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[18p-PG9-1~13] 6.6 Probe microscopy

Tue. Mar 18, 2014 4:00 PM - 6:00 PM PG9 (G棟2階)

4:00 PM - 6:00 PM

[18p-PG9-9] Optimized Measurement of Tapping-AFM based Tip-enhanced Raman Spectroscopy

○(B)Yosuke Fukuhara1, Masamichi Yoshimura1, Daisuke Kosemura2, Atsushi Ogura2, Tomomi Kozu3, Chie Goto4, Tetsunari Kawaguchi4 (Toyota Tech. Inst.1, Meiji Univ.2, NDA3, Bruker4)

Keywords:チップ増強ラマン分光