The 61st JSAP Spring Meeting, 2014

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19a-D5-1~12] 6.6 Probe microscopy

Wed. Mar 19, 2014 9:00 AM - 12:15 PM D5 (D207)

9:45 AM - 10:00 AM

△ [19a-D5-4] Analysis of surface states with a charge amplifier installed in NC-AFM

○Makoto Nogami1, Toyoko Arai2, Akira Sasahara1, Masahiko Tomitori1 (JAIST1, Kanazawa Univ.2)

Keywords:NC-AFM,チャージアンプ,接触電位差