[19a-E12-1~9] 16.3 Bulk, thin-film and other silicon-based solar cells

[19a-E12-6] Acceleration of Potential-induced Degradation by Salt-mist Stress in c-Si PV Modules

Soh Suzuki¹, Naoki Nishiyama², Seiji Yoshino³, Takumi Ujiro², Shin Watanabe³, Takuya Doi⁴, Atsushi Masuda⁴, ^○Tadanori Tanahashi¹ (ESPEC CORP.¹, JFE Techno-Res.², NPC Incorp.³, AIST⁴)

Keywords:太陽電池,信頼性