The 61st JSAP Spring Meeting, 2014

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Oral presentation

16. Amorphous and Microcrystalline Materials » 16.1 Fundamental properties and their evaluation in disordered materials

[19p-D2-1~11] 16.1 Fundamental properties and their evaluation in disordered materials

Wed. Mar 19, 2014 2:00 PM - 5:15 PM D2 (D113)

3:15 PM - 3:30 PM

[19p-D2-5] Photoinduced instability analysis of amorphous oxide semiconductor thin film transistor

○masashi nagai1, kousaku shimizu1 (Nihon Univ.1)

Keywords:酸化物半導体