The 61st JSAP Spring Meeting, 2014

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D5-1~13] 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

4:15 PM - 4:30 PM

[19p-D5-10] Simultaneous measurement of topographic and surface potential images using noncontact scanning nonlinear dielectric microscopy

○Kohei Yamasue1, Yasuo Cho1 (Tohoku Univ.1)

Keywords:走査型非線形誘電率顕微鏡,表面電位