The 61st JSAP Spring Meeting, 2014

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06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D5-1~13] 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

4:45 PM - 5:00 PM

[19p-D5-12] Force spectroscopy on rutile TiO2(110) surface using AFM

○Yoshiaki Sugimoto1, Ayhan Yurtsever2, Delia Fernandez-Torre3, Cesar Gonzalez4, Pavel Jelinek5, Pablo Pou3, Masayuki Abe6, Ruben Perez3, Seizo Morita2 (Osaka Univ.1, Osaka Univ. ISIR2, Univ. Autonoma de Madrid3, ICMM-CSIC4, ASCR5, Nagoya Univ.6)

Keywords:非接触原子間力顕微鏡,二酸化チタン