The 61st JSAP Spring Meeting, 2014

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D5-1~13] 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

2:45 PM - 3:00 PM

[19p-D5-5] Measurement of localized light intensity distribution using force detection

○Takashi Tokuyama1, Junsuke Yamanishi1, Yoshitaka Naitoh1, Yanjun Li1, Yasuhiro Sugawara1 (Osaka univ.1)

Keywords:近接場光,原子間力顕微鏡