[19p-D5-1~13] 6.6 Probe microscopy

[19p-D5-7] Atomic resolution imaging of the local contact potential difference with frequency modulation heterodyne Kelvin probe force microscopy

^○Ryosuke Kanbayashi¹, Lili Kou¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

Keywords:走査型プローブ顕微鏡,ケルビンプローブ力顕微鏡