The 61st JSAP Spring Meeting, 2014

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06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D5-1~13] 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

3:45 PM - 4:00 PM

[19p-D5-8] Measurement of the contact potential difference of Pd atoms on alumina thin film

○Hirotaka Yokoyama1, Yuta Ashida1, Yoshitaka Naitoh1, Yan Jun Li1, Yasuhiro Sugawara1 (Osaka Univ.1)

Keywords:接触電位差