[19p-E3-1~20] 12.4 Organic light-emitting devices and organic transistors

[19p-E3-7] Local potential measurement of organic transistors prepared by drop-casting method using Kelvin-probe force microscopy

^○Yuji Yamagishi¹, Kei Noda², Kei Kobayashi^1,3, Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Dept. of Sci. & Technol., Keio Univ.², The Hakubi Center for Adv. Res., Kyoto Univ.³)

Keywords:ケルビンプローブ原子間力顕微鏡