The 61st JSAP Spring Meeting, 2014

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Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[19p-E8-1~21] 6.3 Oxide-based electronics

Wed. Mar 19, 2014 1:15 PM - 6:45 PM E8 (E202)

6:30 PM - 6:45 PM

[19p-E8-21] Analysis on Carrier Density of the ITO Nanoparticles using Scanning Ellipsometry

○Ai Takenoshita1, Junjun Jia2, Takehiro Yonezawa1, Kazuhiko Yamasaki1, Hiromi Nakazawa1, Yuzo Shigesato2 (Mitsubishi Materials Corp.1, Aoyama Gakuin Univ.2)

Keywords:エリプソメトリー,ITO,赤外線遮蔽